New York attorney record · Judicial Dept 2
Ellise Marie Marthaller
Syracuse University Law School alumna, admitted to the New York bar in 2002, registered office in Valhalla, NY. This established record's status, address, and registration history come straight from the NY Office of Court Administration.
- 2002
- Admitted
- 24
- Years in bar
- 4061586
- NY reg #
The record in one line
Ellise Marie Marthaller has held an active New York bar license for 24 years - admitted in 2002, longer-tenured than 51% of the state's currently-active attorneys.
- 24 yrs
- in active practice since admission
- Active
- current bar status: "Currently registered"
- #59 of 126
- by tenure in Valhalla office peers
- Law school
- Syracuse University Law School
Data updated August 2026
What this profile tells you
Bar status & tenure
Ellise Marie Marthaller carries New York bar registration 4061586, an established, active practitioner in good standing. Registration is recorded within Judicial Department 2, the appellate division overseeing this attorney's home district.
Practice context & education
Practice address is listed under Fujifilm Holdings America Corporation, located in Valhalla, NY (Westchester County), ZIP 10595. 5 other attorneys share this firm affiliation in the registry. Educational background: SYRACUSE UNIVERSITY LAW SCHOOL (46 registered alumni).
State context & due diligence
With an established practice on record, Ellise Marie Marthaller remains inside the New York bar's active cohort - see below for how that share of the register compares.
Experience vs. the active New York bar
Ellise Marie Marthaller was admitted in 2002, giving 24 years on the New York register.
24 years on the New York bar
Years since admission, all currently-active NY attorneys
24 Top 49% higher than 51% of 290,787 active NY attorneys
Each bar is a band; taller bars hold more active NY attorneys. The dashed line + filled bar mark this entry. Hover or tap any bar for its full count, share, and where it sits relative to this entry.
Source NY Office of Court Administration, Attorney Registration · August 2026
Tenure among Valhalla, NY office peers
Against Valhalla, NY's 126-attorney NY register cohort, Ellise Marie Marthaller lands at the 46th tenure percentile (rank #59). See the Valhalla attorney directory .
- Local rank
- #59
- City cohort
- 126
- Local percentile
- 46th
- Admitted
- 2002
Nearest tenure peers in Valhalla
- Rashida Dawn Cartwright admitted 2002 · 24 yr
- Lloyd G. Drummond Jr. admitted 2002 · 24 yr
- Anthony Nicholas Gaeta admitted 2002 · 24 yr
- Christopher F. Gerstle admitted 2002 · 24 yr
How local rank is computed
Rank uses years since NY-bar admission among non-deceased registry rows that list the same office city and state, a local placement, not a statewide claim. Source: NY Office of Court Administration Attorney Registration · as of August 2026. Derived local rank, not published upstream.
Syracuse University Law School's active-bar rate
Of Syracuse University Law School's 46 alumni in the New York register, 60.9% currently hold "Currently registered" status, below the statewide average.
The 2002 admission class today
Of the 7,981 attorneys admitted to the New York bar in 2002, 64.4% are still "Currently registered" today, below the statewide average across all admission years.
Professional Details
- Status
- Currently registered
- Registration Number
- 4061586
- Year Admitted
- 2002 (24 yrs · senior)
- Judicial Department
- 2
- Next Registration
- Apr 2028
Location & Contact
- Company
- Fujifilm Holdings America Corporation
- City
- Valhalla, NY
- County
- Westchester
- ZIP Code
- 10595
- Phone
- (914) 217-5789
Education
Status Distribution Across the New York Bar
Ellise Marie Marthaller's current status, "Currently registered", places this attorney in the 67.2% of the 432,625-attorney New York register currently marked active.
Full statewide breakdown & source note
Source: NY Office of Court Administration, Attorney Registrations. Status counts reflect the latest reporting cycle. Bar status confirms registration only; it does not imply competence, specialty fit, or freedom from complaints.
Same firm affiliation: Fujifilm Holdings America Corporation
Other NY-registered attorneys who share this firm name on the OCA register (not a geographic peer set).
Near-tenure Syracuse University Law School alumni
Fellow alumni on the NY register whose admission year is closest to 2002 (excluding same-firm colleagues above).
Same admission year (2002), other cities
NY-registered attorneys admitted in 2002 whose listed office city differs from Valhalla, a vintage cohort, not a neighborhood list.
Nationwide attorneys with similar admission year or city registry density
Two non-geo peer axes for Ellise Marie Marthaller: closest NY bar admission year outside NY, and closest out-of-state office cities by how many NY-registered attorneys they list (~127 here). Distinct from same-firm, fellow-alumni, and same-year other-city strips above.
Similar admission year (~2002)
Counts come from the NY State Office of Court Administration registration extract; peers are not a competence or practice-area ranking.
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Compare attorneys →Before you rely on this record
Ellise Marie Marthaller's "Currently registered" listing confirms bar standing only, it is a registration fact to verify, not a verdict on quality or competence.
Frequently Asked Questions
Where is Ellise Marthaller licensed?
Ellise Marthaller is licensed to practice law in New York.
When was Ellise Marie Marthaller admitted to the bar?
Ellise Marie Marthaller was admitted to the bar in 2002.
Where did Ellise Marie Marthaller go to law school?
Ellise Marie Marthaller attended SYRACUSE UNIVERSITY LAW SCHOOL.
What company does Ellise Marie Marthaller work for?
Ellise Marie Marthaller is associated with Fujifilm Holdings America Corporation in Valhalla, NY.
Is Ellise Marie Marthaller in good standing?
Yes, Ellise Marie Marthaller holds active bar status ("Currently registered").
Cite this page & disclosure
Sourced from the NY Office of Court Administration, informational only, not legal advice. Full disclosure.
Read our methodology - how this data is sourced, computed, and verified.