New York attorney record · Judicial Dept 1
John F. Schultz
Univ Of Pennsylvania alumna, admitted to the New York bar in 1990, registered office in Spring, TX. Decades of status, address, and registration history on this record come straight from the NY Office of Court Administration.
- 1990
- Admitted
- 36
- Years in bar
- 2367597
- NY reg #
The record in one line
John F. Schultz appears in the New York attorney register with a current status of "Due to reregister within 30 days of birthday", on record since 1990 - an administrative designation rather than discipline, but confirm current standing with the state bar.
- 36 yrs
- since first admission to the bar
- Pending-renewal
- current bar status: "Due to reregister within 30 days of birthday"
- #5 of 41
- by tenure in Spring office peers
- Law school
- Univ Of Pennsylvania
Data updated September 2026
What this profile tells you
Bar status & tenure
John F. Schultz is registered as bar number 2367597 with the New York bar authority, carrying a current status of "Due to reregister within 30 days of birthday", a routine periodic-renewal reminder, not discipline. Registration is recorded within Judicial Department 1, the appellate division overseeing this attorney's home district.
Practice context & education
Practice address is listed under Hewlett Packard Enterprise, located in Spring, TX, ZIP 77389. 5 other attorneys share this firm affiliation in the registry. Educational background: UNIV OF PENNSYLVANIA.
State context & due diligence
A "Due to reregister within 30 days of birthday" status falls outside the New York bar's active cohort for now. The breakdown below shows what share of the register that represents.
Tenure among Spring, TX office peers
Within Spring, TX's 41-attorney local set, John F. Schultz is #5 by tenure, a small-cohort read, not a statewide claim. See the Spring attorney directory .
- Local rank
- #5
- City cohort
- 41
- Local percentile
- 10th
- Admitted
- 1990
Nearest tenure peers in Spring
- Richard Edward Byrne admitted 1989 · 37 yr
- Robert Gerard Clyne admitted 1989 · 37 yr
- Karin Barbara Sinniger admitted 1991 · 35 yr
- Abhijit Modak admitted 1993 · 33 yr
How local rank is computed
Rank uses years since NY-bar admission among non-deceased registry rows that list the same office city and state, a local placement, not a statewide claim. Source: NY Office of Court Administration Attorney Registration · as of September 2026. Derived local rank, not published upstream.
How John compares to fellow Univ Of Pennsylvania alumni
Among the 629 Univ Of Pennsylvania graduates in the New York register, John F. Schultz is longer-tenured than 50%.
36 years vs. Univ Of Pennsylvania alumni
Years since admission - 629 NY-registered alumni of this school
36 Top 50% higher than 50% of 629 fellow alumni
Each bar is a band; taller bars hold more fellow alumni. The dashed line + filled bar mark this entry. Hover or tap any bar for its full count, share, and where it sits relative to this entry.
Source NY Office of Court Administration, Attorney Registration · September 2026
The 1990 admission class today
Of the 6,112 attorneys admitted to the New York bar in 1990, 56.3% are still "Currently registered" today, below the statewide average across all admission years.
Professional Details
- Status
- Due to reregister within 30 days of birthday
- Registration Number
- 2367597
- Year Admitted
- 1990 (36 yrs · veteran)
- Judicial Department
- 1
- Next Registration
- Apr 2026
Location & Contact
- Company
- Hewlett Packard Enterprise
- City
- Spring, TX
- ZIP Code
- 77389
- Phone
- (650) 521-7789
Education
UNIV OF PENNSYLVANIA
Status Distribution Across the New York Bar
John F. Schultz's current status, "Due to reregister within 30 days of birthday", places this record outside the 67.2% of the 432,625-attorney New York register currently marked active.
Full statewide breakdown & source note
Source: NY Office of Court Administration, Attorney Registrations. Status counts reflect the latest reporting cycle. Bar status confirms registration only; it does not imply competence, specialty fit, or freedom from complaints.
Same firm affiliation: Hewlett Packard Enterprise
Other NY-registered attorneys who share this firm name on the OCA register (not a geographic peer set).
Near-tenure Univ Of Pennsylvania alumni
Fellow alumni on the NY register whose admission year is closest to 1990 (excluding same-firm colleagues above).
Same admission year (1990), other cities
NY-registered attorneys admitted in 1990 whose listed office city differs from Spring, a vintage cohort, not a neighborhood list.
Nationwide attorneys with similar admission year or city registry density
Two non-geo peer axes for John F. Schultz: closest NY bar admission year outside TX, and closest out-of-state office cities by how many NY-registered attorneys they list (~42 here). Distinct from same-firm, fellow-alumni, and same-year other-city strips above.
Similar admission year (~1990)
Counts come from the NY State Office of Court Administration registration extract; peers are not a competence or practice-area ranking.
Verify This Attorney
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Compare attorneys →Before you rely on this record
John F. Schultz is currently listed as "Due to reregister within 30 days of birthday", treat that as a registration fact to confirm, not a verdict on quality.
Frequently Asked Questions
Where is John Schultz licensed?
John Schultz is licensed to practice law in New York.
When was John F. Schultz admitted to the bar?
John F. Schultz's admission to the New York bar dates back to 1990.
Where did John F. Schultz go to law school?
John F. Schultz attended UNIV OF PENNSYLVANIA.
What company does John F. Schultz work for?
John F. Schultz is associated with Hewlett Packard Enterprise in Spring, TX.
Is John F. Schultz in good standing?
Not currently, John F. Schultz's listed status is "Due to reregister within 30 days of birthday", not active standing. Confirm current status with the state bar.
Cite this page & disclosure
Sourced from the NY Office of Court Administration, informational only, not legal advice. Full disclosure.
Read our methodology - how this data is sourced, computed, and verified.