New York attorney record · Judicial Dept 2
Michael Patrick Jones
Hofstra University Maurice A. Deane School Of Law alumna, admitted to the New York bar in 2002, registered office in Commack, NY. This established record's status, address, and registration history come straight from the NY Office of Court Administration.
- 2002
- Admitted
- 24
- Years in bar
- 3980570
- NY reg #
The record in one line
Michael Patrick Jones carries a "Delinquent" status on the New York bar register, on record since 2002 - confirm the exact standing and any discipline history directly with the state bar before engaging.
- 24 yrs
- since first admission to the bar
- Suspended
- current bar status: "Delinquent"
- #92 of 129
- by tenure in Commack office peers
- Law school
- Hofstra University Maurice A. Deane School Of Law
Data updated September 2026
What this profile tells you
Bar status & tenure
Michael Patrick Jones is registered as bar number 3980570 with the New York bar authority, carrying a current status of "Delinquent", suspended or delinquent, verify terms with the bar before engaging. Registration is recorded within Judicial Department 2, the appellate division overseeing this attorney's home district.
Practice context & education
Practice address is listed under Martin, Fallon & Mulle, located in Commack, NY (Suffolk County), ZIP 11725. Educational background: Hofstra University Maurice A. Deane School of Law.
State context & due diligence
A "Delinquent" status falls outside the New York bar's active cohort. The breakdown below shows what share of the register that represents, and how to verify current standing directly with the state bar.
Tenure among Commack, NY office peers
Against Commack, NY's 129-attorney NY register cohort, Michael Patrick Jones lands at the 71st tenure percentile (rank #92). See the Commack attorney directory .
- Local rank
- #92
- City cohort
- 129
- Local percentile
- 71st
- Admitted
- 2002
Nearest tenure peers in Commack
- Barbara Bonvicino-Touhamy admitted 2002 · 24 yr
- Frank Thomas Gargano admitted 2002 · 24 yr
- Todd David Hashinsky admitted 2002 · 24 yr
- Alexandra M. Hennessy admitted 2002 · 24 yr
How local rank is computed
Rank uses years since NY-bar admission among non-deceased registry rows that list the same office city and state, a local placement, not a statewide claim. Source: NY Office of Court Administration Attorney Registration · as of September 2026. Derived local rank, not published upstream.
How Michael compares to fellow Hofstra University Maurice A. Deane School Of Law alumni
Among the 3,425 Hofstra University Maurice A. Deane School Of Law graduates in the New York register, Michael Patrick Jones is longer-tenured than 81%.
24 years vs. Hofstra University Maurice A. Deane School Of Law alumni
Years since admission - 3,425 NY-registered alumni of this school
24 Top 19% higher than 81% of 3,425 fellow alumni
Each bar is a band; taller bars hold more fellow alumni. The dashed line + filled bar mark this entry. Hover or tap any bar for its full count, share, and where it sits relative to this entry.
Source NY Office of Court Administration, Attorney Registration · September 2026
The 2002 admission class today
Of the 7,981 attorneys admitted to the New York bar in 2002, 64.4% are still "Currently registered" today, below the statewide average across all admission years.
Professional Details
- Status
- Delinquent
- Registration Number
- 3980570
- Year Admitted
- 2002 (24 yrs · senior)
- Judicial Department
- 2
- Next Registration
- Mar 2026
Location & Contact
- Company
- Martin, Fallon & Mulle
- City
- Commack, NY
- County
- Suffolk
- ZIP Code
- 11725
- Phone
- (631) 421-1211
Education
Hofstra University Maurice A. Deane School of Law
Status Distribution Across the New York Bar
Michael Patrick Jones's current status, "Delinquent", places this record outside the 67.2% of the 432,625-attorney New York register currently marked active.
Full statewide breakdown & source note
Source: NY Office of Court Administration, Attorney Registrations. Status counts reflect the latest reporting cycle. Bar status confirms registration only; it does not imply competence, specialty fit, or freedom from complaints.
Near-tenure Hofstra University Maurice A. Deane School Of Law alumni
Fellow alumni on the NY register whose admission year is closest to 2002 (excluding same-firm colleagues above).
Same admission year (2002), other cities
NY-registered attorneys admitted in 2002 whose listed office city differs from Commack, a vintage cohort, not a neighborhood list.
Nationwide attorneys with similar admission year or city registry density
Two non-geo peer axes for Michael Patrick Jones: closest NY bar admission year outside NY, and closest out-of-state office cities by how many NY-registered attorneys they list (~130 here). Distinct from same-firm, fellow-alumni, and same-year other-city strips above.
Similar admission year (~2002)
Counts come from the NY State Office of Court Administration registration extract; peers are not a competence or practice-area ranking.
Verify This Attorney
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Compare attorneys →Before you rely on this record
Michael Patrick Jones carries a "Delinquent" status. Verify the exact scope and dates of this action directly with the state bar before acting on it.
Frequently Asked Questions
Where is Michael Jones licensed?
Michael Jones is licensed to practice law in New York.
When was Michael Patrick Jones admitted to the bar?
Michael Patrick Jones was admitted to the bar in 2002.
Where did Michael Patrick Jones go to law school?
Michael Patrick Jones attended Hofstra University Maurice A. Deane School of Law.
What company does Michael Patrick Jones work for?
Michael Patrick Jones is associated with Martin, Fallon & Mulle in Commack, NY.
Is Michael Patrick Jones in good standing?
No, Michael Patrick Jones carries a "Delinquent" status, not active standing. Confirm the exact scope directly with the state bar before engaging.
Cite this page & disclosure
Sourced from the NY Office of Court Administration, informational only, not legal advice. Full disclosure.
Read our methodology - how this data is sourced, computed, and verified.