New York attorney record · Judicial Dept 3
Patricia Patterson Werschulz
Rutgers-Newark alumna, admitted to the New York bar in 2010, registered office in Havertown, PA. This established record's status, address, and registration history come straight from the NY Office of Court Administration.
- 2010
- Admitted
- 16
- Years in bar
- 4770988
- NY reg #
The record in one line
Patricia Patterson Werschulz has held an active New York bar license for 16 years - admitted in 2010, longer-tenured than 38% of the state's currently-active attorneys.
- 16 yrs
- in active practice since admission
- Active
- current bar status: "Currently registered"
- #7 of 7
- by tenure in Havertown office peers
- Law school
- Rutgers-Newark
Data updated August 2026
What this profile tells you
Bar status & tenure
Patricia Patterson Werschulz carries New York bar registration 4770988, an established, active practitioner in good standing. Registration is recorded within Judicial Department 3, the appellate division overseeing this attorney's home district.
Practice context & education
Practice address is listed under Werschulz Patent Law, LLC, located in Havertown, PA, ZIP 19083. Educational background: RUTGERS-NEWARK.
State context & due diligence
With an established practice on record, Patricia Patterson Werschulz remains inside the New York bar's active cohort - see below for how that share of the register compares.
Experience vs. the active New York bar
Patricia Patterson Werschulz was admitted in 2010, giving 16 years on the New York register.
16 years on the New York bar
Years since admission, all currently-active NY attorneys
16 Top 62% higher than 38% of 290,787 active NY attorneys
Each bar is a band; taller bars hold more active NY attorneys. The dashed line + filled bar mark this entry. Hover or tap any bar for its full count, share, and where it sits relative to this entry.
Source NY Office of Court Administration, Attorney Registration · August 2026
Tenure among Havertown, PA office peers
Havertown, PA carries only 7 NY-registered attorneys with an admission year on file; Patricia Patterson Werschulz is #7 by tenure in that small local set. See the Havertown attorney directory .
- Local rank
- #7
- City cohort
- 7
- Local percentile
- 86th
- Admitted
- 2010
Nearest tenure peers in Havertown
- Heather E. Rutman admitted 2005 · 21 yr
- Nicholas Wagner admitted 2015 · 11 yr
- Christopher V. Vitale admitted 2002 · 24 yr
- Joan Anderson Tarka admitted 1995 · 31 yr
How local rank is computed
Rank uses years since NY-bar admission among non-deceased registry rows that list the same office city and state, a local placement, not a statewide claim. Source: NY Office of Court Administration Attorney Registration · as of August 2026. Derived local rank, not published upstream.
How Patricia compares to fellow Rutgers-Newark alumni
Among the 229 Rutgers-Newark graduates in the New York register, Patricia Patterson Werschulz is longer-tenured than 4%.
16 years vs. Rutgers-Newark alumni
Years since admission - 229 NY-registered alumni of this school
16 Top 96% higher than 4% of 229 fellow alumni
Each bar is a band; taller bars hold more fellow alumni. The dashed line + filled bar mark this entry. Hover or tap any bar for its full count, share, and where it sits relative to this entry.
Source NY Office of Court Administration, Attorney Registration · August 2026
The 2010 admission class today
Of the 10,128 attorneys admitted to the New York bar in 2010, 69.6% are still "Currently registered" today, above the statewide average across all admission years.
Professional Details
- Status
- Currently registered
- Registration Number
- 4770988
- Year Admitted
- 2010 (16 yrs · senior)
- Judicial Department
- 3
- Next Registration
- Jul 2028
Location & Contact
- Company
- Werschulz Patent Law, LLC
- City
- Havertown, PA
- ZIP Code
- 19083
- Phone
- (908) 313-2347
Education
RUTGERS-NEWARK
Status Distribution Across the New York Bar
Patricia Patterson Werschulz's current status, "Currently registered", places this attorney in the 67.2% of the 432,625-attorney New York register currently marked active.
Full statewide breakdown & source note
Source: NY Office of Court Administration, Attorney Registrations. Status counts reflect the latest reporting cycle. Bar status confirms registration only; it does not imply competence, specialty fit, or freedom from complaints.
Near-tenure Rutgers-Newark alumni
Fellow alumni on the NY register whose admission year is closest to 2010 (excluding same-firm colleagues above).
Same admission year (2010), other cities
NY-registered attorneys admitted in 2010 whose listed office city differs from Havertown, a vintage cohort, not a neighborhood list.
Nationwide attorneys with similar admission year or city registry density
Out-of-state NY bar peers for Patricia Patterson Werschulz with the closest admission year to 2010. Distinct from same-firm, fellow-alumni, and same-year other-city strips above.
Counts come from the NY State Office of Court Administration registration extract; peers are not a competence or practice-area ranking.
Verify This Attorney
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Compare attorneys →Before you rely on this record
Patricia Patterson Werschulz's "Currently registered" listing confirms bar standing only, it is a registration fact to verify, not a verdict on quality or competence.
Frequently Asked Questions
Where is Patricia Werschulz licensed?
Patricia Werschulz is licensed to practice law in New York.
When was Patricia Patterson Werschulz admitted to the bar?
Patricia Patterson Werschulz was admitted to the bar in 2010.
Where did Patricia Patterson Werschulz go to law school?
Patricia Patterson Werschulz attended RUTGERS-NEWARK.
What company does Patricia Patterson Werschulz work for?
Patricia Patterson Werschulz is associated with Werschulz Patent Law, LLC in Havertown, PA.
Is Patricia Patterson Werschulz in good standing?
Yes, Patricia Patterson Werschulz holds active bar status ("Currently registered").
Cite this page & disclosure
Sourced from the NY Office of Court Administration, informational only, not legal advice. Full disclosure.
Read our methodology - how this data is sourced, computed, and verified.